Defect detecting apparatus and method
The present invention provides a defect detecting apparatus and method. According to an embodiment, the apparatus includes: a storage unit that stores a predetermined one standard image and at least one captured image obtained by photographing a test object; and a control unit that calculates a diff...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The present invention provides a defect detecting apparatus and method. According to an embodiment, the apparatus includes: a storage unit that stores a predetermined one standard image and at least one captured image obtained by photographing a test object; and a control unit that calculates a difference between the standard image and each captured image to generate a difference object corresponding to each captured image, combines the standard image, each captured image, and each difference image to generate at least one color image corresponding to each captured image, and performs defect detection model learning and/or defect detection by using the generated color image.
本发明提出缺陷检测装置及方法,根据一实施例,缺陷检测装置包括:存储部,储存预定的一个标准图像和,拍摄检验对象获得的至少一个拍摄图像;以及控制部,运算标准图像和各拍摄图像的差异,生成对应各个拍摄图像的差分对象,将标准图像、各拍摄图像和各差分图像合成,生成对应各拍摄图像的至少一个彩色图像,利用生成的彩色图像实施缺陷检测模型的学习或缺陷检测中至少一个。 |
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