System and detection method for checking wrong selection of thin film filters based on machine vision

The invention provides a system for checking the wrong selection of thin film filters based on machine vision. The system comprises a carrying box, a spectrum analyzer, a detecting device and an imagecomparison system; an arrangement area where the thin film filters can be distributed in an array is...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LI JINGHUI, ZHU HONGGAN, YAO YAXING
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
Online-Zugang:	Volltext bestellen
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