System and detection method for checking wrong selection of thin film filters based on machine vision

The invention provides a system for checking the wrong selection of thin film filters based on machine vision. The system comprises a carrying box, a spectrum analyzer, a detecting device and an imagecomparison system; an arrangement area where the thin film filters can be distributed in an array is...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LI JINGHUI, ZHU HONGGAN, YAO YAXING
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a system for checking the wrong selection of thin film filters based on machine vision. The system comprises a carrying box, a spectrum analyzer, a detecting device and an imagecomparison system; an arrangement area where the thin film filters can be distributed in an array is defined in the carrying box; the spectrum analyzer is used for performing spectrum analysis on thethin film filters arranged in the carrying box and transmitting a spectrum analysis result to the image comparison system; and the detecting device includes an illumination assembly which illuminatesthin film filters which are left after some thin film filters are selected from the carrying box and a camera for performing image acquisition on the thin film filters which are left after some thinfilm filters are selected, and transmitting image acquisition information to the image comparison system. Compared with the prior art, the system and the detection method perform spectrum test on thethin film filters to be detec