Device and method for obtaining optimum structure detection function of structure detection microimaging system

The invention provides a device and method for obtaining an optimum structure detection function of structure detection microimaging system, and relates to the field of microimaging. In order to solvethe problem that the structure detection function of an existing structure detection microimaging sy...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TAN JIUBIN, ZOU LIMIN, YIN ZHE, NI HE, LI BO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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