Device and method for obtaining optimum structure detection function of structure detection microimaging system
The invention provides a device and method for obtaining an optimum structure detection function of structure detection microimaging system, and relates to the field of microimaging. In order to solvethe problem that the structure detection function of an existing structure detection microimaging sy...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a device and method for obtaining an optimum structure detection function of structure detection microimaging system, and relates to the field of microimaging. In order to solvethe problem that the structure detection function of an existing structure detection microimaging system is not the optimum structure detection function, and thus the resolution ratio of imaging is low. The method for obtaining the optimum structure detection function of the structure detection microimaging system comprises the steps that firstly, a modulate image on a modulate surface of a spatial light modulator is randomly generated and is taken as an initial structure detection function; secondly, restructured image information and light intensity distribution information of various sampling point faculae are obtained; and thirdly, the structure detection function is adjusted by comparing obtained overall error and the light intensity distribution information in a point-by-point modeaccording to restructured |
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