Testing device, testing system, and testing method

A testing device includes a testing socket and a reflector. The testing socket defines an accommodating space. The reflector is disposed in the accommodating space and has a plurality of reflection surfaces non-parallel with each other. The reflection surfaces define a transmission space. 本发明提供一种测试装...

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Bibliographische Detailangaben
Hauptverfasser: WANG YENUN, LIU IUN, HUANG HUNG-JEN, CHU CHEN-KUO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:A testing device includes a testing socket and a reflector. The testing socket defines an accommodating space. The reflector is disposed in the accommodating space and has a plurality of reflection surfaces non-parallel with each other. The reflection surfaces define a transmission space. 本发明提供一种测试装置,其包含测试基座和反射器。所述测试基座界定容纳空间。所述反射器安置于所述容纳空间中且具有彼此非平行的多个反射表面。所述反射表面界定发射空间。