High-frequency conduction interference experimental platform and test method for primary-secondary integrated power distribution switch

The invention relates to a high-frequency conduction interference experimental platform and test method for a primary-secondary integrated power distribution switch. The platform comprises a primary device and a secondary device. The test method includes the following steps that: a current set value...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	ZHANG ZHIHUA, GAN XINGLIN, QI ZETAO, WANG JIANHUI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!