High-frequency conduction interference experimental platform and test method for primary-secondary integrated power distribution switch

The invention relates to a high-frequency conduction interference experimental platform and test method for a primary-secondary integrated power distribution switch. The platform comprises a primary device and a secondary device. The test method includes the following steps that: a current set value...

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Bibliographische Detailangaben
Hauptverfasser: ZHANG ZHIHUA, GAN XINGLIN, QI ZETAO, WANG JIANHUI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to a high-frequency conduction interference experimental platform and test method for a primary-secondary integrated power distribution switch. The platform comprises a primary device and a secondary device. The test method includes the following steps that: a current set value is set for a primary-secondary integrated power distribution switch under test; and a power frequency current close to the set value is applied to the switch under test through a current booster, and at the same time, a ball gap discharges, so that high-frequency signals are generated, and whetherthe switch under test will wrongly act is tested. According to the high-frequency conduction interference experimental platform and test method for the primary-secondary integrated power distributionswitch of the invention, an experimental loop is constructed to simulate high-frequency conduction interference signals generated by the discharge arc of the middle gap of a system; a misoperation test, failure-to-act test, an