High-frequency conduction interference experimental platform and test method for primary-secondary integrated power distribution switch
The invention relates to a high-frequency conduction interference experimental platform and test method for a primary-secondary integrated power distribution switch. The platform comprises a primary device and a secondary device. The test method includes the following steps that: a current set value...
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creator | ZHANG ZHIHUA GAN XINGLIN QI ZETAO WANG JIANHUI |
description | The invention relates to a high-frequency conduction interference experimental platform and test method for a primary-secondary integrated power distribution switch. The platform comprises a primary device and a secondary device. The test method includes the following steps that: a current set value is set for a primary-secondary integrated power distribution switch under test; and a power frequency current close to the set value is applied to the switch under test through a current booster, and at the same time, a ball gap discharges, so that high-frequency signals are generated, and whetherthe switch under test will wrongly act is tested. According to the high-frequency conduction interference experimental platform and test method for the primary-secondary integrated power distributionswitch of the invention, an experimental loop is constructed to simulate high-frequency conduction interference signals generated by the discharge arc of the middle gap of a system; a misoperation test, failure-to-act test, an |
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According to the high-frequency conduction interference experimental platform and test method for the primary-secondary integrated power distributionswitch of the invention, an experimental loop is constructed to simulate high-frequency conduction interference signals generated by the discharge arc of the middle gap of a system; a misoperation test, failure-to-act test, an</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190531&DB=EPODOC&CC=CN&NR=109828202A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190531&DB=EPODOC&CC=CN&NR=109828202A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHANG ZHIHUA</creatorcontrib><creatorcontrib>GAN XINGLIN</creatorcontrib><creatorcontrib>QI ZETAO</creatorcontrib><creatorcontrib>WANG JIANHUI</creatorcontrib><title>High-frequency conduction interference experimental platform and test method for primary-secondary integrated power distribution switch</title><description>The invention relates to a high-frequency conduction interference experimental platform and test method for a primary-secondary integrated power distribution switch. 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According to the high-frequency conduction interference experimental platform and test method for the primary-secondary integrated power distributionswitch of the invention, an experimental loop is constructed to simulate high-frequency conduction interference signals generated by the discharge arc of the middle gap of a system; a misoperation test, failure-to-act test, an</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjUEKwjAURLtxIeodvgcoaN3UpRTFlSv3JSbTNtAm8ecX9QRe21g8gKsZhsebefY-27bLG8Z9hNMv0t6ZUYv1jqwTcANOOwjPALYDnKieQq-k8TyQcoYEUWiAdN5QGikkTPErj_i6UptELSuBoeAfYDI2CtvbON3EhxXdLbNZo_qI1S8X2fp0vFbnHMHXiEFpOEhdXbabfVmUxaY47P5hPrAhTeo</recordid><startdate>20190531</startdate><enddate>20190531</enddate><creator>ZHANG ZHIHUA</creator><creator>GAN XINGLIN</creator><creator>QI ZETAO</creator><creator>WANG JIANHUI</creator><scope>EVB</scope></search><sort><creationdate>20190531</creationdate><title>High-frequency conduction interference experimental platform and test method for primary-secondary integrated power distribution switch</title><author>ZHANG ZHIHUA ; GAN XINGLIN ; QI ZETAO ; WANG JIANHUI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN109828202A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2019</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHANG ZHIHUA</creatorcontrib><creatorcontrib>GAN XINGLIN</creatorcontrib><creatorcontrib>QI ZETAO</creatorcontrib><creatorcontrib>WANG JIANHUI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHANG ZHIHUA</au><au>GAN XINGLIN</au><au>QI ZETAO</au><au>WANG JIANHUI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>High-frequency conduction interference experimental platform and test method for primary-secondary integrated power distribution switch</title><date>2019-05-31</date><risdate>2019</risdate><abstract>The invention relates to a high-frequency conduction interference experimental platform and test method for a primary-secondary integrated power distribution switch. 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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | High-frequency conduction interference experimental platform and test method for primary-secondary integrated power distribution switch |
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