METHOD FOR MEASURING VARNISH FILM THICKNESS OF PRINTED ARTICLE AND VARNISH FILM THICKNESS MEASUREMENT DEVICE

The present invention is a method for measuring the varnish film thickness of a printed article by obtaining the film thickness of varnish on a sheet (1) on which a pattern is printed on a base thereof with ink and the pattern is coated with the varnish, wherein a metal foil (1c) having a smooth sur...

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1. Verfasser: NUMAUCHI HIROMITSU
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The present invention is a method for measuring the varnish film thickness of a printed article by obtaining the film thickness of varnish on a sheet (1) on which a pattern is printed on a base thereof with ink and the pattern is coated with the varnish, wherein a metal foil (1c) having a smooth surface is attached to the base of the sheet (1), and the film thickness of the varnish coated directlyover the metal foil (1c) is detected with a spectral interference-type film thickness meter (81) so as to determine whether the film thickness of the varnish is acceptable or not on the basis of theresults detected by the spectral interference-type film thickness meter (81). 本发明提供印刷品的清漆膜厚测定方法和清漆膜厚测定装置。印刷品的清漆膜厚测定方法求出利用油墨在基体上印刷有图案并在所述图案上涂布有清漆的薄片体(1)的清漆膜厚,其中,在薄片体(1)的基体上附加具有光滑表面的金属箔(1c),利用分光干涉膜厚仪(81)来检测直接涂布在金属箔(1c)上的清漆的膜厚,并且基于由分光干涉膜厚仪(81)检测出的结果来判断清漆膜厚的良否。