Electronic component testing device

The invention discloses an electronic component testing device, which comprises a supporting bottom plate. The top of the supporting bottom plate is fixedly connected with a straight guide rail. The right side of the surface of the straight guide rail is fixedly connected with an insulation fixing block through a locking bolt. The insulation fixing block is matched with the straight guide rail. The top of the straight guide rail is fixedly connected with a positive electrode copper plate through first fixing bolts and the number of the first fixing bolts is four. The left side of the surface of the straight guide rail is connected with a sliding block in a sliding mode. The top of the sliding block is fixedly connected with a negative electrode copper plate through second fixing bolts. According to the invention, based on the cooperative application of the supporting bottom plate, the sliding block, the fixing block, a first short rod, a pressure spring, a second short rod, the positive electrode copper plate