LED flash lamp chip testing system
The invention discloses an LED flash lamp chip test system, which comprises an MCU module, an FPGA module, an OS test module, an IDD test module, a SINK CURRENT test module and an FREQ test module, wherein the MCU module, the FPGA module and the OS test module are used for detecting whether a protec...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an LED flash lamp chip test system, which comprises an MCU module, an FPGA module, an OS test module, an IDD test module, a SINK CURRENT test module and an FREQ test module, wherein the MCU module, the FPGA module and the OS test module are used for detecting whether a protection diode on an IC pin is intact or not; the IDD test module is used for testing current magnitudewhen an LED flash lamp chip works and evaluating power loss when the chip works; the SINK CURRENT test module is used for testing output drive current of the LED flash lamp chip; and the FREQ test module is used for measuring working main frequency of the LED flash lamp chip. By the adoption of the LED flash lamp chip test system, a full-function parameter test of a chip IC is realized, and a low-cost test solution is provided for actual test and production of the IC; and meanwhile, in an actual production process, the problems of high cost and the like of universal test equipment are solved,thereby greatly improving |
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