Analog-to-digital-converter-based automatic calibration device and method for integrated circuit test system

The invention provides an analog-to-digital-converter-based automatic calibration device and method for an integrated circuit test system. With the integrated circuit test system, for the test processof an analog-to-digital converter, calibration of dynamic parameters of an integrated circuit test system voltage source is realized but programming on the integrated circuit test system for channelcontrolling is not needed. The integrated circuit test system tests a differential linear error (DNL) or an integral linear error (INL) of the analog-to-digital converter and compares the test resultswith a DNL value or INL value of an actual fixed value. Therefore, the calibration of the dynamic parameters of the voltage source driving of the integrated circuit test system is realized. 本发明提供的种基于模数转换器的集成电路测试系统自动校准装置及方法，通过集成电路测试系统对模数转换器的测试过程实现集成电路测试系电压源的动态参数的校准，而无须在集成电路测试系统上编程对通道进行控制，集成电路测试系统通过对模数转换器的差分线性误差DNL或积分线性误差INL的测试，并将测量结果与实际定值的差分线性误差DNL或者积分线性误差INL值进行对比。实现了对集成电路测试系统电压源驱动动态参数的校准。