Method for debugging lapping-in rate of trunk lid plate die profile

The invention discloses a method for debugging a lapping-in rate of a trunk lid plate die profile. The method comprises the steps that S1, a positioning hole is punched in a plate piece through a first-order die in the debugging process of the first-order die; S2, a positioning device is arranged on...

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Bibliographische Detailangaben
Hauptverfasser: XIANG HAIXIAO, YAN GUOWEI, DAI LI, WEI JIE, YANG HONGFEI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a method for debugging a lapping-in rate of a trunk lid plate die profile. The method comprises the steps that S1, a positioning hole is punched in a plate piece through a first-order die in the debugging process of the first-order die; S2, a positioning device is arranged on a second-order die; S3, the plate piece is placed on the second-order die, the plate piece is positioned by the positioning device, and debugging of the profile lapping-in rate of the second-order die is carried out. The method for debugging the lapping-in rate of the trunk lid plate die profile has the advantages that the positioning hole is processed in the plate piece in the debugging process of the previous order, the corresponding positioning device is arranged on the later-order die, theplate piece is positioned by the positioning device when the lapping-in rate of the later-order die profile is debugged, so that it is ensured that the position of the plate piece is accurate, and thestate of the plate piece