Low-temperature photoluminescence rapid and efficient test method

The invention belongs to the technical field of photoelectric device test, and relates to a low-temperature photoluminescence rapid and efficient test method. A device related in the method comprisesa sample room, a low temperature micromotor, a to-be-tested sample, a sample rack, a convex lens, a light filter, a momochromator, incident laser, photoluminescence, reflecting laser, and a detector.The power switch of the connected low temperature micromotor and a rotation speed control circuit enable the sample rack in the low temperature sample room to rotate, incident laser irradiates any to-be-tested sample, so that photoluminescence light paths of all to-be-tested samples are identical, multiple samples can be tested through temperature reduction once, and the test precision and test speed are improved greatly. The device has the characteristics of simple structure, high efficiency and shorter test time. 本发明属于光电器件测试技术领域，涉及种低温光致发光快速高效测试方法，该方法中涉及装置是由样品室、低温微电机、待测样品、样品架、凸透镜、滤光片、单色仪、入射激光、光致发光、反射激光和探测器组成，通过连接的低温微电