Method for automatically adjusting gas phase optical path of magnetic force microscope based on least square method and threshold segmentation
The invention discloses a method for automatically adjusting the gas phase optical path of a magnetic force microscope based on least square method and threshold value division. Firstly, a stepping motor capable of two-dimensional movement through computer control is installed on a probe stand. Then...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method for automatically adjusting the gas phase optical path of a magnetic force microscope based on least square method and threshold value division. Firstly, a stepping motor capable of two-dimensional movement through computer control is installed on a probe stand. Then the stepping motor is used to adjust the optical path automatically. The adjustment process includes calibration stage and implementation stage. The invention realizes the automatic adjustment of the reflected light path of the magnetic force microscope by adding an electric motor for moving the probe frame in the atomic force microscope system and relevant calculation, and has the advantages of simple operation and accurate positioning, and avoids eye fatigue and even damage of the operator.
本发明公开了种基于最小二乘和阈值分割的磁力显微镜气相光路自动调整方法,首先需要在探针架装设能通过计算机控制进行二维移动的步进电机;然后利用步进电机进行光路自动调整的自动调整,调整过程包括标定阶段和实施阶段。本发明通过在原子力显微镜系统中加设用于移动探针架的电机,并通过相关计算实现对磁力显微镜反射光路的自动调整,具有操作简便、定位精准的优点,避免操作者眼疲劳甚至出现损伤的情况。 |
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