Single-circuit carrier type space tester

The invention relates to a single-circuit carrier type space tester. A majority of conventional technical methods related to determination of the properties and parameters of spatial micro-objects adopt the mode that each sensitive device corresponds to a set of a power supply, a circuit and an instrument, so a universal circuit is needed. A field generated by configuration changing of charges ina circuit, i.e., a circuit parasitic electrical effect generated by electrical interaction of the charges with spatial substances surrounding the circuit, is discovered to be able to be explained withcontinuous electric phase shift. The circuit parasitic electrical effect is converted into a special power supply through linkage of two crystal diodes, and the power of the special power supply canfully support a certain carrier. Thus, the single-circuit carrier type space tester provided by the invention has the following superiorities: a variety of sensitive devices can be clamped into the single-circuit carrier type s