Determination method and device of micro-fracture

The embodiment of the application provides a determination method and device of a micro-fracture. The method comprises the following steps: acquiring post-stack seismic data of a target region; determining a curvature data volume of the target region according to the post-stack seismic data; computi...

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Bibliographische Detailangaben
Hauptverfasser: CHAI QIAOYING, SUN TINGBIN, TIAN SHUANG, YU ZHILONG, JIANG HONGYU
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The embodiment of the application provides a determination method and device of a micro-fracture. The method comprises the following steps: acquiring post-stack seismic data of a target region; determining a curvature data volume of the target region according to the post-stack seismic data; computing a self-related function of a seismic trace in the target region according to the curvature data volume of the target region; determining the micro-fracture of the target region according to the self-related function of the seismic trace; since the advantages of the curvature data volume and the coherent technology on the micro-fracture identification are comprehensively considered, the self-related function of the seismic trace is computed by using the above curvature data volume based on a related mechanism of the coherent technology after computing the curvature data volume of the target region, and then the micro-fracture is identified and determined according to the angle of the self-related function of the