Detection method and detection system for transparent material surface and internal defects

The invention discloses a detection method and a detection system for transparent material surface and internal defects. The detection system comprises an optical measurement system, an optical analysis system and a color confocal data processing program, wherein the optical measurement system is us...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YE RUIFANG, LI ZIQING, CUI CHANGCAI, YANG CHENG, YU QING, ZHOU RUILAN, ZHANG KUN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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