Detection method and detection system for transparent material surface and internal defects
The invention discloses a detection method and a detection system for transparent material surface and internal defects. The detection system comprises an optical measurement system, an optical analysis system and a color confocal data processing program, wherein the optical measurement system is us...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a detection method and a detection system for transparent material surface and internal defects. The detection system comprises an optical measurement system, an optical analysis system and a color confocal data processing program, wherein the optical measurement system is used for outputting light, receiving reflected light of the surface and internal defects of a measuredtransparent material and outputting the reflected light to the optical analysis system; the optical analysis system is used for receiving the reflected light of the surface and internal defects of the transparent material; and the color confocal data processing program is used for analyzing the reflected light obtained by the optical analysis system so as to obtain a wavelength value corresponding to a reflection peak and then processing the wavelength value so as to obtain the information of the surface and internal defects of the measured transparent material. The invention also provides the detection method of the |
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