Three-dimensional particle configuration method based on planar Fourier contour analysis

Three-dimensional particle configuration method based on planar Fourier contour analysis

The invention relates to a three-dimensional particle configuration method based on planar Fourier contour analysis. The method comprises the following steps: (1) performing two-dimensional particle contour Fourier analysis for any section contour line of a classical particle over-centroid, acquirin...

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Hauptverfasser: ZHOU YUXIAN, XU QINGQING, PEI YABING, QI PENGYING, DENG HUIFANG, ZHENG SHANXI, LI CHAOZHEN, HUANG XIAOFENG, ZHANG JUNXIAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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container_title
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creator ZHOU YUXIAN
XU QINGQING
PEI YABING
QI PENGYING
DENG HUIFANG
ZHENG SHANXI
LI CHAOZHEN
HUANG XIAOFENG
ZHANG JUNXIAN
description The invention relates to a three-dimensional particle configuration method based on planar Fourier contour analysis. The method comprises the following steps: (1) performing two-dimensional particle contour Fourier analysis for any section contour line of a classical particle over-centroid, acquiring the classical particle contour Fourier spectrum; (2) randomly endowing argument for each order based on the acquired Fourier spectrum value, and randomly generating a corresponding contour by using Fourier inverse conversion spectrum; (3) adjusting random contours of multiple over-centroids, and obtaining a geometric contour mutual matching scheme; (4) inferring radial distance of the three-dimensional particle by using a radial function interpolation, acquiring the three-dimensional particleconfiguration, and then obtaining any three-dimensional particle contour inferring; and (5) outputting. Through the method provided by the invention, a large number of the particles can be randomly generated through individua
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Three-dimensional particle configuration method based on planar Fourier contour analysis
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