Three-dimensional particle configuration method based on planar Fourier contour analysis
The invention relates to a three-dimensional particle configuration method based on planar Fourier contour analysis. The method comprises the following steps: (1) performing two-dimensional particle contour Fourier analysis for any section contour line of a classical particle over-centroid, acquirin...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a three-dimensional particle configuration method based on planar Fourier contour analysis. The method comprises the following steps: (1) performing two-dimensional particle contour Fourier analysis for any section contour line of a classical particle over-centroid, acquiring the classical particle contour Fourier spectrum; (2) randomly endowing argument for each order based on the acquired Fourier spectrum value, and randomly generating a corresponding contour by using Fourier inverse conversion spectrum; (3) adjusting random contours of multiple over-centroids, and obtaining a geometric contour mutual matching scheme; (4) inferring radial distance of the three-dimensional particle by using a radial function interpolation, acquiring the three-dimensional particleconfiguration, and then obtaining any three-dimensional particle contour inferring; and (5) outputting. Through the method provided by the invention, a large number of the particles can be randomly generated through individua |
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