Method and device for calculating measure index of non-overlapping community set quality

The invention provides a method and device for calculating quality measure indexes of non-overlapping community sets. A vertex set V is obtained by acquiring elements in each community in community sets X and Y, the community sets X and Y are traversed, a community tag data set LidList is constructe...

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Hauptverfasser: LUO QIUMING, WU YUANSHI, FENG YUHONG, SHE SONG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention provides a method and device for calculating quality measure indexes of non-overlapping community sets. A vertex set V is obtained by acquiring elements in each community in community sets X and Y, the community sets X and Y are traversed, a community tag data set LidList is constructed, then based on a grouping strategy of key modulus of LidList, the set LidList is cut by a key andis distributed to each process, each process carries out calculation, a value needed in calculating each index is obtained, and finally values are combined into a single process to carry out operationto obtain the metric indexes of the community sets X and Y. According to the method, a parallel distributed computing framework MPI is used and the calculation speed of the community set metric indexes is increased by using community tags, at the same time, more measure indexes can be calculated at the same time through the method for calculating the quality measure indexes of the community sets,and the method is suitable