Method and system for testing device noise

The invention discloses a method and system for testing device noise. The method comprises the following steps: testing background noise of a test site to obtain a background noise value; testing noise of a target device running in the test site to obtain a running noise value; correcting the running noise value according to the background noise value and auxiliary parameters, and obtaining a noise real value of the target device, wherein the auxiliary parameters includes climate parameters. According to the invention, through correcting influence of background noise and climate factors and the like on the target device, the obtained noise value becomes more real, the testing accuracy is ensured, and the real noise value of the target device is obtained. 本发明公开了种测试设备噪音的方法及系统，方法包括：对测试场所的背景噪音进行测试，获得背景噪音值；测试目标设备在所述测试场所运行时的噪音，获得运行噪音值；根据所述背景噪音值以及辅助参数对所述运行噪音值进行修正，获得所述目标设备的噪音真实值，所述辅助参数包括气候参数。本发明通过对目标设备进行了背景噪音以及气候因素等影响的修正，使得到的噪音值更加真实，保证了测试的精确度，更加符合目标设备的实际噪音值。