Measuring system for measuring three-dimensional contour of workpiece

The invention relates to a measuring system for measuring the three-dimensional contour of a workpiece. The measuring system comprises a workbench, a controller and a data processing and analysis system. The system also comprises a structured light measurement system, a tip and turntable system and...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HUANG JUNHUI, WANG ZHAO, HE ZENGFAN, XING CHAO, QI ZHAOSHUAI, GAO JIANMIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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