Measuring system for measuring three-dimensional contour of workpiece
The invention relates to a measuring system for measuring the three-dimensional contour of a workpiece. The measuring system comprises a workbench, a controller and a data processing and analysis system. The system also comprises a structured light measurement system, a tip and turntable system and...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a measuring system for measuring the three-dimensional contour of a workpiece. The measuring system comprises a workbench, a controller and a data processing and analysis system. The system also comprises a structured light measurement system, a tip and turntable system and a three-coordinate measurement system, which are arranged on the workbench. The structured light measurement system is used for measuring the complex curved surface of the workpiece in a high-speed manner; the three-coordinate measurement system is used for measuring the complex fine portion of theworkpiece to ensure obtaining of high-precision and reliable measurement data of the portion, wherein the measurement data of the three-coordinate measurement system is used for establishing a measurement reference of the workpiece; the tip and turntable system is used for clamping the workpiece and driving the workpiece to rotate to obtain measurement data of the workpiece at different angles bycombining the structured l |
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