Testing apparatus of exposure time of imaging device
The invention discloses a testing apparatus of exposure time of an imaging device, which is used for testing the exposure time of the imaging device. The testing apparatus comprises a first scanning mechanism, a second scanning mechanism and a controller, the first scanning mechanism comprises a poi...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | The invention discloses a testing apparatus of exposure time of an imaging device, which is used for testing the exposure time of the imaging device. The testing apparatus comprises a first scanning mechanism, a second scanning mechanism and a controller, the first scanning mechanism comprises a point light source and a first reflector, the first reflector is used for reflecting light emitted by the point light source, and one of the point light source and the first reflector is rotationally arranged relative to the other one so as to enable the outgoing light of the first scanning mechanism presents periodical scanning; the second scanning mechanism comprises a second reflector and a reflection plate,, or the second scanning mechanism comprises the reflection plate, thus, the light is enabled to form a scanning path at different positions of the reflection plate within each scanning period; the imaging device is arranged relative to the reflection plate so as to form a bright line corresponding to the scanni |
|---|