Infrared camera parameter calibration plate

The invention relates to the field of optical measurement, and in particular relates to an infrared camera parameter calibration plate. The infrared camera parameter calibration plate comprises a lighttight substrate, wherein a round hole array M*N is arranged on the substrate, and the rows and colu...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WU YIMING, CHEN TING, HUANG HONGXIN, YANG RONGQIAN, SONG MENGCHUN, WU HAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
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Beschreibung
Zusammenfassung:The invention relates to the field of optical measurement, and in particular relates to an infrared camera parameter calibration plate. The infrared camera parameter calibration plate comprises a lighttight substrate, wherein a round hole array M*N is arranged on the substrate, and the rows and columns are perpendicular. The infrared camera parameter calibration plate is characterized by also comprising a positioning hole, wherein the positioning hole is arranged at one corner of the round hole array, and reflecting cloth is arranged in round holes of the round hole array. The substrate is a square aluminum alloy plate with a certain thickness, and thus is not prone to deform. From the surface of the substrate to the position that is 0.01mm-0.5mm away from the back of the substrate, the diameters of the round holes are gradually reduced from the surface to the inside along the thickness direction of the substrate. The invention aims at providing the passive light emitting infrared light source calibration pla