Measuring system for measuring an imaging quality of an EUV lens
A measuring system (10) for measuring an imaging quality of an EUV lens (30) comprises: a diffractive test structure (26), a measurement light radiating device (16) which is configured to radiate measurement light (21) in the EUV wavelength range onto the test structure, a variation device (28) for...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | A measuring system (10) for measuring an imaging quality of an EUV lens (30) comprises: a diffractive test structure (26), a measurement light radiating device (16) which is configured to radiate measurement light (21) in the EUV wavelength range onto the test structure, a variation device (28) for varying at least one image-determining parameter of an imaging of the test structure that is effected by means of a lens, a detector (14) for recording an image stack comprising a plurality of images generated with different image-determining parameters being set, and an evaluation device (15) whichis configured to determine the imaging quality of the lens from the image stack.
种用于测量EUV镜头(30)的成像质量的测量系统(10),包括:衍射测试结构(26);测量光辐射装置(16),构造成将EUV波长范围中的测量光(21)辐射至测试结构;变更装置(28),用于改变借助镜头实现的测试结构的成像的至少个像确定参数;探测器(14),用于记录像堆,所述像堆包括在设定不同像确定参数的情况下产生的多个像;以及评估装置(15),构造成从像堆确定镜头的成像质量。 |
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