Space charge measuring device suitable for interface effect research and measuring method thereof

The invention provides a space charge measuring device suitable for interface effect research and a measuring method thereof. The measuring device successively comprises a pulse coupling circuit cavity, a test cavity and a base from top to bottom. A pulse coupling circuit connected with an external...

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Bibliographische Detailangaben
Hauptverfasser: YAN JIAQI, ZHANG HONGLIANG, SU XIALIN, MO YUNHAO, LIU PENG, ZHANG SIYU
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a space charge measuring device suitable for interface effect research and a measuring method thereof. The measuring device successively comprises a pulse coupling circuit cavity, a test cavity and a base from top to bottom. A pulse coupling circuit connected with an external high voltage source and a pulse source is arranged in the pulse coupling circuit cavity. The sidewall of the pulse coupling circuit cavity is provided with a hole and is connected with a normal temperature oil bath pipeline. The sidewall of the test cavity is provided with a hole and is connected with a high temperature oil bath pipeline. The measuring method comprises the steps that according to the required contact closeness between a sample and an upper electrode, a corresponding spring is taken into a spring cavity; the spring is pushed by an electrode seat; the upper electrode required for a test is arranged on an upper electrode seat; the sample is placed at the center of the upper surface of a lower electrod