METHOD AND SYSTEM FOR DETERMINING CIRCUIT FAILURE RATE

A method involves determining failure in time rate for a circuit. The method may include obtaining circuit data regarding a circuit. The circuit may include a first wire segment and a second wire segment. The method may further include obtaining reliability data. The reliability data may describe a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	STANLEY DOUGLAS, AU WAI CHUNG WILLIAM, SARASWAT GOVIND
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!