METHOD AND SYSTEM FOR DETERMINING CIRCUIT FAILURE RATE

A method involves determining failure in time rate for a circuit. The method may include obtaining circuit data regarding a circuit. The circuit may include a first wire segment and a second wire segment. The method may further include obtaining reliability data. The reliability data may describe a failure of the circuit over a pre-determined time period. The method may further include obtaining athermal map. The method may further include determining a first failure rate for the first wire segment of the circuit. The first failure rate may be a probability that the first wire segment fails in a predetermined amount of time. The method may further include determining a second failure rate for the second wire segment of the circuit. The method may further include generating a model of thecircuit. The model of the circuit may describe the first and the second failure rate of the circuit. 种方法涉及确定电路的时间故障率。该方法可以包括获得关于电路的电路数据。电路可以包括第导线片段和第二导线片段。该方法还可以包括获得可靠性数据。可靠性数据描述电路在预定时间段内的故障。该方法还可以包括获得热图。该方法还可以包括确定电路的第导线片段的第故障