Testing system, testing method and testing clamp for electromagnetic parameters of graphene material
The invention relates to a testing system, method and clamp for electromagnetic parameters of a graphene material. The system comprises a testing clamp, a vector network analyzer and a data processingdevice, wherein the testing clamp comprises an outer clamp and an embedded type clamp arranged in th...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a testing system, method and clamp for electromagnetic parameters of a graphene material. The system comprises a testing clamp, a vector network analyzer and a data processingdevice, wherein the testing clamp comprises an outer clamp and an embedded type clamp arranged in the outer clamp; the outer clamp is provided with a reflection testing port and a transmission testing port, which are connected with the vector network analyzer; the embedded type clamp is used for clamping a graphene material testing sample; the vector network analyzer is used for measuring scattering parameters of end connection surfaces of the reflection testing port and the transmission testing port of the outer clamp; the data processing device is used for carrying out phase compensation onthe scattering parameters of the end connection surfaces of the reflection testing port and the transmission testing port, so as to obtain scattering parameters of an end face of the graphene material testing sample and calcu |
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