Interference testing method for SONOS flash

The invention discloses an interference testing method for an SONOS flash. The interference testing method comprises the following steps: step 1, providing the SONOS flash needing the interference test, setting the interference degradation parameters; step 2, continuously operating a target storage unit of the SONOS flash according to the set interference degradation parameters; step 3, testing the threshold voltage of the adjacent storage unit, and screening the adjacent storage unit whose threshold voltage is out of scope. The interference degradation parameters are set before the continuousoperation, the continuous operation is carried out according to the interference degradation parameters, the adjacent storage unit is rapidly interfered and degraded in the continuous operation, so that the time for the continuous operation is saved, the testing time is finally shortened, the testing speed is increased, and the testing cost is saved. 本发明公开了种SONOS闪存的干扰性测试方法，包括如下步骤：步骤、提供需要进行干扰性测试的SONOS闪存，设置干扰性劣化参数。步骤二、按照所设