Analytical method and device of organic outer insulation surface appearance

The invention provides an analytical method and an analytical device of organic outer insulation surface appearance, and relates to the technical field of an electrical system. The method includes steps of acquiring scanning data of an organic outer insulation surface; confirming a continuous wavele...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG SHUYUAN, WANG XUN, GAO YANFENG, WANG XIN, FAN SHUOCHAO, XUE WENXIANG, LI XIN, GONG ZHIFENG, XI DONGSHENG, ZHANG JIFEI, YANG JING, ZHANG XU, CHEN YUAN, WANG YONG, LU YI, KANG TIEFENG, GONG YANXING, DING BIN, LI WEI, JIA LINING, WANG HUI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
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