Analytical method and device of organic outer insulation surface appearance

The invention provides an analytical method and an analytical device of organic outer insulation surface appearance, and relates to the technical field of an electrical system. The method includes steps of acquiring scanning data of an organic outer insulation surface; confirming a continuous wavelet function according to a four-order Daubechies wavelet; confirming a continuous wavelet transforming result of the scanning data, and converting to be a corresponding a discrete wavelet transform result; confirming the discrete wavelet function; performing multi-dimension analysis, generating low-pass and high-pass filters under different dimensions; performing decomposing treatment of a low-pass wave filter and a high-pass wave filter under the first dimension on the scanning data along the line direction, and forming a first two-dimensional matrix result; performing decomposing treatment of the low-pass wave filter and the high-pass wave filter under the first dimension on the two-dimensional matrix result along