Device for measuring thickness of ice layer based on magnetic elastic material

The invention relates to a device for measuring the thickness of an ice layer, specifically relates to a device for measuring the thickness of the ice layer based on a magnetic elastic material, belongs to the technical field of automatic detection, and solves problems that a conventional contact-ty...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: BAI QIAOQIAO, CHENG PENG, JIA XINGWANG, YANG XINYU, DENG XIAO, ZHANG YU, ZHANG LI, CUI LIQIN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to a device for measuring the thickness of an ice layer, specifically relates to a device for measuring the thickness of the ice layer based on a magnetic elastic material, belongs to the technical field of automatic detection, and solves problems that a conventional contact-type ice layer thickness measurement device is complex in structure or is big in measurement error. The device comprises a sensing unit and a measurement control unit. The sensing unit comprises an annular cylindrical housing, the magnetic elastic material, a magnetic elastic material support, an AC coil, a DC coil, a chip selection circuit, and a coil support. The magnetic elastic material comprises a plurality of magnetic vibration units which are sequentially connected. The measurement controlunit comprises an impedance measurement circuit, a DC bias circuit, a single-chip microcomputer, a serial port circuit, and a power circuit. The device can clearly determine the position of the upperand lower interface of the