semiconductor device and measuring method

A semiconductor device and a measuring method are provided. There is a need for high-order frequency measurement without greatly increasing consumption currents and chip die sizes. The semiconductor device includes: an electric power measuring portion that performs electric power measurement; a high...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ROBERT NOLF, RICHARD DALBY, MAKOTO SHUTO, KAZUYOSHI KAWAI, MITSUYA FUKAZAWA
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING CONTROL OF AMPLIFICATION DECODING ELECTRICITY IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RESONATORS TESTING
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