semiconductor device and measuring method

A semiconductor device and a measuring method are provided. There is a need for high-order frequency measurement without greatly increasing consumption currents and chip die sizes. The semiconductor device includes: an electric power measuring portion that performs electric power measurement; a high-order frequency measuring portion that performs high-order frequency measurement; and a clock controller that supplies an electric power measuring portion with a first clock signal at a first sampling frequency and supplies a high-order frequency measuring portion with a second clock signal at a second sampling frequency. The second sampling frequency is higher than the first sampling frequency. 本公开涉及半导体器件和测量方法。需要高阶频率测量而不大幅增加消耗电流和芯片管芯尺寸。种半导体器件包括：电功率测量部，执行电功率测量；高阶频率测量部，执行高阶频率测量；以及时钟控制器，向电功率测量部提供第采样频率下的第时钟信号，并且向高阶频率测量部提供第二采样频率下的第二时钟信号。第二采样频率高于第采样频率。