MEASUREMENT TIME DISTRIBUTION IN REFERENCING SCHEMES

Methods and systems for measurement time distribution (1276, 1277, 1278) for referencing schemes are disclosed. The disclosed methods and systems are capable of dynamically changing the measurement time distribution based on the sample signal, reference signal, noise levels, and SNR. The methods and systems are configured with a plurality of measurement states, including a sample measurement state(1282), reference measurement state (1284), and dark measurement state (1286). In some examples, the measurement time distribution scheme can be based on the operating wavelength, the measurement location at the sampling interface, and/or targeted SNR. Examples of the disclosure further include systems and methods for measuring the different measurement states concurrently. Moreover, the systemsand methods can include a high-frequency detector to eliminate or reduce decorrelated noise fluctuations that can lower the SNR. 本发明公开了用于参考方案的测量时间分布(1276,1277,1278)的方法和系统。本公开的方法和系统能够基于样本信号、参考对象信号、噪声水平和SNR动态地改变测量时间分布。该方法和系统被配置有