Data reconstructing method for estimating integrated type isolated circuit breaker defect library

The invention discloses a data reconstructing method for estimating an integrated type isolated circuit breaker defect library. A traditional circuit breaker is compared with all parts of an integrated type isolation circuit breaker, and same parts and different parts are obtained through comparison...

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Hauptverfasser: HAN LIU, BAI YAO, LI JINGBIN, LIU YAHUI, XIA TIAN, GU SONGLIN, HUANG SHUO, SONG XUANKUN, LI DEGE, QUAN JIANGTAO, FENG YING, DUAN ZHONGPING, FANG HUALIANG, WANG HAIMING, HU AO, WANG CHENGZHI, CHEN JUN, ZHANG JI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a data reconstructing method for estimating an integrated type isolated circuit breaker defect library. A traditional circuit breaker is compared with all parts of an integrated type isolation circuit breaker, and same parts and different parts are obtained through comparison analysis; for the same parts, defect data in a traditional transformer substation is directly written in the integrated type isolated circuit breaker defect library; for the different parts, the improvement points of the parts of the integrated type isolation circuit breaker are analyzed, and defect data eliminated by improvement is deleted, the rest of defect data is written in the integrated type isolated circuit breaker defect library. Considering the overall improvement advantages of the integrated type isolated circuit breaker, the obtained defect data is optimized, and the integrated type isolated circuit breaker defect library closer to the actual situation is obtained. Through datareconstruction, data devi