Integrated circuit testing device
The invention provides an integrated circuit testing device which comprises an elastic rubber and a fixing device. The elastic rubber includes a plurality of conductive holes and an insulating regionfor isolating the plurality of conductive holes. The fixing device includes a pressing plate and a fi...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides an integrated circuit testing device which comprises an elastic rubber and a fixing device. The elastic rubber includes a plurality of conductive holes and an insulating regionfor isolating the plurality of conductive holes. The fixing device includes a pressing plate and a fixing column. The fixing column is used for locking the pressing plate to the elastic rubber so thatpins of an integrated circuit are closely electrically connected to conductive regions. The elastic rubber of the integrated circuit testing device of the invention may further include an insulatingregion and the plurality of conductive regions exposed on the surface of the elastic rubber. The integrated circuit testing device of the invention is particularly applicable to low-profile package type integrated circuits.
本发明提供种集成电路测试装置,其包含弹性橡胶及固定装置。该弹性橡胶包含多个导电孔及用于隔绝该多个导电孔的绝缘区。该固定装置包含压板及固定柱,该固定柱用于将该压板锁向该弹性橡胶,使该集成电路的管脚紧密地电连接于该导电区。本发明的集成电路测试装置的弹性橡胶还可包含绝缘区及多个外露于该弹性橡胶表面的导电区。本发明特别适用于小轮廓封装型集成电路。 |
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