Method and apparatus for electrical component life estimation
Systems and methods for estimating electrical component degradation caused by an operating parameter that stresses the component in a series of stress cycles, in which cycle count values are maintained which individually correspond to a range of values of the operating parameter, and a plurality of...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | Systems and methods for estimating electrical component degradation caused by an operating parameter that stresses the component in a series of stress cycles, in which cycle count values are maintained which individually correspond to a range of values of the operating parameter, and a plurality of maximum cycle values are stored, which individually correspond to one of the ranges and represent the number of stress cycles in the corresponding range at which the component is expected to have a user defined failure probability value. For a given stress cycle, one of the count values is incremented that corresponds to the range that includes a measured or sensed value, and a cumulative degradation value for the electrical system component is computed as a sum of ratios of the individual countvalues to the corresponding maximum cycle values.
公开了用于估计由在系列应力循环中对部件施加应力的操作参数引起的电气部件劣化的系统和方法,其中,保存循环计数值,所述循环计数值各自与操作参数的值的定范围对应,并且存储多个最大循环值,所述最大循环值各自与其中个范围对应并且表示在部件被预计具有用户定义的失效概率值的对应范围内的应力循环次数。对于给定的应力循环,对计数值中的与包括测量值或感测值的范围对应 |
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