Analysis method of embedded system dysfunctions, associated computer program product and analysis device

The invention relates to an analysis method of embedded system dysfunctions, an associated computer program product and an analysis device. An embedded system includes a phase (PM) for modeling this system and an analysis phase (PA). The modeling phase (PM) includes defining (110) a set of resources (110), a set of services (120), a set of statuses (130) and at least one rule (140) for the acquisition of a status by a resource or by a service. The analysis phase (PA) includes configuring (150) the analysis including marking a marked event and analyzing (160) acquisition rules to determine a set of basic events and conditions for the appearance thereof, leading to the appearance of the marked basic event. 本发明涉及种用于分析嵌入式系统的功能异常的方法、计算机程序产品和分析设备。该嵌入式系统包括用于对该系统进行建模(PM)的阶段和分析阶段(PA)。建模阶段(PM)包括以下步骤：定义(110)组资源(110)、组服务(120)、组状态(130)和至少个规则(140)用于由资源或服务获取状态。分析阶段(PA)包括以下步骤：对分析进行配置(150)，包括对标记的事件进行标记；以及分析(160)获取规则以确定组基本事件和其出现的条件、从而导致出现标记的基本事件。