Machine-mounted scanning rack device for time-of-flight diffraction (TOFD) detection
The invention provides a machine-mounted scanning rack device for time-of-flight diffraction (TOFD) detection. The device comprises a fixing rack, a connecting rack, a main support, probe brackets andprobes, wherein the connecting rack is hinged under the fixing rack by means of a rotating shaft; th...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a machine-mounted scanning rack device for time-of-flight diffraction (TOFD) detection. The device comprises a fixing rack, a connecting rack, a main support, probe brackets andprobes, wherein the connecting rack is hinged under the fixing rack by means of a rotating shaft; the main support is fixed at the end part of the connecting rack, and is provided with the two probebrackets in a symmetrical way; the free ends of the probe brackets are respectively provided with a probe mounting rack, and the probes are respectively installed on the probe mounting racks; a lifting release module is also arranged between the fixing rack and the main support, and is used for controlling the lifting and release of the main support. The scanning rack device provided by the invention improves the accuracy of detection results and the detection precision; the scanning rack device is improved into a machine-mounted type from a hand-held type, so that the detection efficiency isgreatly improved; furthermo |
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