On-line overlap rate monitoring method for laser additive manufacturing
The invention discloses an on-line overlap rate monitoring method for laser additive manufacturing. The on-line overlap rate monitoring method is characterized in that an on-line image processing unitand an on-line overlap rate processing unit are added on the basis of an original on-line monitoring...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention discloses an on-line overlap rate monitoring method for laser additive manufacturing. The on-line overlap rate monitoring method is characterized in that an on-line image processing unitand an on-line overlap rate processing unit are added on the basis of an original on-line monitoring system. The on-line image processing unit comprises a grey processing module, an image filtering and denoising module, a width feature extraction module and an overlap part feature extraction module; and the on-line overlap rate processing unit can modify obtained overlap rate features according to data of the on-line image processing unit and position and pose information of the on-line monitoring system, and the actual overlap value and overlap rate value are obtained on line. The on-line overlap rate monitoring method for laser additive manufacturing realizes quick and reliable monitoring of the overlap rate for laser additive manufacturing through image calibration, acquisition, pre-treatment, modification, co |
---|