On-line overlap rate monitoring method for laser additive manufacturing

The invention discloses an on-line overlap rate monitoring method for laser additive manufacturing. The on-line overlap rate monitoring method is characterized in that an on-line image processing unitand an on-line overlap rate processing unit are added on the basis of an original on-line monitoring...

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Bibliographische Detailangaben
Hauptverfasser: LIU WEIWEI, YAN ZHAORUI, LIU XUYANG, ZHANG HONGCHAO, ZHANG NAN, TANG ZIJUE
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses an on-line overlap rate monitoring method for laser additive manufacturing. The on-line overlap rate monitoring method is characterized in that an on-line image processing unitand an on-line overlap rate processing unit are added on the basis of an original on-line monitoring system. The on-line image processing unit comprises a grey processing module, an image filtering and denoising module, a width feature extraction module and an overlap part feature extraction module; and the on-line overlap rate processing unit can modify obtained overlap rate features according to data of the on-line image processing unit and position and pose information of the on-line monitoring system, and the actual overlap value and overlap rate value are obtained on line. The on-line overlap rate monitoring method for laser additive manufacturing realizes quick and reliable monitoring of the overlap rate for laser additive manufacturing through image calibration, acquisition, pre-treatment, modification, co