PATTERN DETECTION

The present disclosure there is provided a pattern detection unit (300; 400) comprising a shift register (302; 402) configured to over-sample a multi-bit input signal such that each bit of the input signal is represented by a plurality of samples in the shift register (302; 402); and a correlator (304; 404) configured to compare a target pattern with two or more of the plurality of samples of eachbit from the shift register (302; 402) in order to determine whether or not the input signal matches the target pattern. 本公开提供种型式检测单元(300；400)，所述型式检测单元(300；400)包括：移位寄存器(302；402)，所述移位寄存器(302；402)被配置成过采样多位输入信号，使得所述输入信号的每位由所述移位寄存器(302；402)中的多个样本表示；以及相关器(304；404)，所述相关器(304；404)被配置成比较目标型式与来自所述移位寄存器(302；402)的每位的所述多个样本中的两者或多于两者，以便确定所述输入信号是否匹配于所述目标型式。