Device for preparing X-ray nanometer CT metal micro test sample based on local electrochemical etching

The invention discloses a device for preparing a nanometer CT metal micro test sample based on local electrochemical etching. The device comprises a precise position control unit, an electrochemical etching unit and a real-time monitoring unit, wherein the precise position control unit is used for t...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YOU ZESHENG, LIU JIAOLIN, FU HUANGLIU, WANG HAO, WANG YANING
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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