Method and device for measuring quality factor of near-surface stratum
The invention discloses a method and device for measuring a quality factor of a near-surface stratum, and belongs to the technical field of petroleum seismic exploration. The method comprises the steps of respectively determining frequency spectrums of seismic waves detected by a first detector and...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method and device for measuring a quality factor of a near-surface stratum, and belongs to the technical field of petroleum seismic exploration. The method comprises the steps of respectively determining frequency spectrums of seismic waves detected by a first detector and a second detector, wherein the first detector and the second detector are respectively arranged at the bottom and the mouth of a reception well, the seismic waves are excited by an excitation point arranged at the bottom of an excitation well, the depth of the excitation well is greater than the thickness of a low-velocity layer, and the depth of the reception well is less than the thickness of the low-velocity layer; determining a frequency spectrum of seismic waves detected by a plurality of third detectors; and determining a quality factor of the near-surface stratum based on the frequency spectrums of the seismic waves respectively detected by the first detector, the second detector andthe plurality of third de |
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