SYSTEMS AND METHODS FOR SENSOR PLATFORM

An apparatus is provided for a sensor platform. The sensor platform includes a sensor mount adapted to receive a sensing device, and a first articulation system that has a first rotational axis. The sensor platform includes a second articulation system that has a second rotational axis, and the seco...

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Bibliographische Detailangaben
1. Verfasser:	KO YUNGANG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PERFORMING OPERATIONS PHYSICS TARIFF METERING APPARATUS TESTING TRANSPORTING VEHICLES IN GENERAL VEHICLES, VEHICLE FITTINGS, OR VEHICLE PARTS, NOT OTHERWISEPROVIDED FOR
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Beschreibung
Zusammenfassung:	An apparatus is provided for a sensor platform. The sensor platform includes a sensor mount adapted to receive a sensing device, and a first articulation system that has a first rotational axis. The sensor platform includes a second articulation system that has a second rotational axis, and the second rotational axis is different than the first rotational axis. The sensor platform includes a basethat supports the first articulation system, the second articulation system and the sensor mount. The first articulation system and the second articulation system are independently movable to define two degrees of freedom for positioning the sensor platform. 提供了用于传感器平台的设备。该传感器平台包括适用于接纳感测装置的传感器底座以及具有第旋转轴线的第铰接系统。该传感器平台包括具有第二旋转轴线的第二铰接系统，且第二旋转轴线不同于第旋转轴线。该传感器平台包括基座，基座支撑第铰接系统、第二铰接系统和传感器底座。第铰接系统和第二铰接系统可独立地移动以限定用于定位该传感器平台的两个自由度。